D
Series
Signal Integrity’s D Series 0.8mm pitch spring probes define the standard for high-power, high-speed testing in rugged environments. Capable of handling industry-leading currents up to 6.0 Amps (D4525, D4601) while delivering bandwidths exceeding 38 GHz, this series is engineered for the most demanding WLCSP and BGA applications. With ultra-low contact resistance down to 20 mOhms, the D Series provides maximum signal fidelity and power delivery in a robust 0.8mm form factor.
D SERIES: HIGH-PERFORMANCE 0.8MM PITCH SPRING PROBES
Engineered for high-volume manufacturing, the D Series 0.8mm pitch spring probes deliver an unmatched combination of power and precision. Compare our top models below to find the ideal balance of current handling, spring force, and resistance for your specific test environment.
| Model | Initial Length (inch / mm) |
Op. Position (inch / mm) |
Spring Force | Bandwidth (Insertion Loss) |
Current (Max) |
Resistance | Inductance |
|---|---|---|---|---|---|---|---|
| D4525 | .087″ / 2.21 | .071″ / 1.80 | 30 g | 38.5 GHz | 6.0 A | 20 mΩ | 0.48 nH |
| D4565 | .092″ / 2.33 | .071″ / 1.80 | 30 g | 17.0 GHz | 6.0 A | 25 mΩ | 0.5 nH |
| D4601 | .214″ / 5.43 | .186″ / 4.72 | 24, 34 g | 12.8 GHz | 6.0 A | 50 mΩ | 1.0 nH |
| D4623 | .289″ / 7.33 | .253″ / 6.43 | 34 g | 8.2 GHz | 5.4 A | 60 mΩ | 1.55 nH |
| D4595 | .154″ / 3.91 | .128″ / 3.25 | 38 g | 19.5 GHz | 3.0 A | 30 mΩ | 0.82 nH |
| D4693 | .185″ / 4.71 | .157″ / 4.00 | 24, 34 g | 18.3 GHz | 3.0 A | 40 mΩ | 0.92 nH |
| D4613 | .249″ / 6.32 | .213-.216″ / 5.49 | 24, 34 g | 14.3 GHz | 2.15 A | 40 mΩ | 1.25 nH |
| D4603 | .209″ / 5.30 | .181″ / 4.59 | 24 g | 12.4 GHz | 4.0 A | 70 mΩ | 1.16 nH |
| D4697 | .339″ / 8.61 | .295″ / 7.50 | 32 g | 8.6 GHz | 2.6 A | 45 mΩ | 2.01 nH |
| D4694 | .185″ / 4.71 | .157″ / 4.00 | 23, 36 g | 7.8 GHz | 3.0 A | 40 mΩ | 0.80 nH |
| D4823 | .289″ / 7.33 | .253″ / 6.43 | 28 g | – | – | – | – |
Overview
Key Features of Our 0.8mm Pitch Spring Probes
- Industry-Leading Power: The D Series features multiple models capable of handling 6.0 Amps continuous current (D4525, D4601), ideal for high-power semiconductor testing.
- Extreme Bandwidth: Delivers exceptional RF performance with insertion loss < -1dB up to 38.5 GHz (D4525) and consistent performance across the series.
- Ultra-Low Resistance: Solid precious metal alloys achieve contact resistance as low as 20 mOhms, minimizing voltage drop and self-heating.
- Versatile Length Options: Available in a wide range of Z-heights, from compact 2.21mm profiles for short signal paths to extended 8.61mm probes for complex stack-ups.
- Robust Mechanics: Designed with high spring forces (up to 38g) to cut through contaminants and ensure reliable contact in high-volume production.
Semiconductor Contacts D Series – 0.8MM (.0315) Pitch
D4525 – The Ultimate Performer
Unmatched combination of high speed and high power in a short profile.
- Pitch: 0.8mm
- Bandwidth: 38.5 GHz
- Current Rating: 6.0 A
- Resistance: 20 mΩ
- Length: 2.21mm
D4601 – High Power Standard
The go-to solution for high-current applications in a standard length.
- Pitch: 0.8mm
- Current Rating: 6.0 A
- Bandwidth: 12.8 GHz
- Force: 24g, 34g
- Resistance: 50 mΩ
D4595 – High Bandwidth Precision
Excellent signal integrity for mid-length testing requirements.
- Pitch: 0.8mm
- Bandwidth: 19.5 GHz
- Current Rating: 3.0 A
- Force: 38g (High Force)
- Resistance: 30 mΩ
D4697 – Extended Reach
Long profile probe designed for maximum clearance and reach.
- Pitch: 0.8mm
- Length: 8.61mm (0.339″)
- Bandwidth: 8.6 GHz
- Force: 32g
- Current: 2.6 A
D4693 – RF Precision
Balanced RF performance for 18 GHz applications.
The D4693 offers a versatile solution for mixed-signal testing, providing reliable 18 GHz performance with standard current handling.
- Pitch: 0.8mm
- Bandwidth: 18.3 GHz
- Current: 3.0 A
- Resistance: 40 mΩ
Browse the full catalog of Signal Integrity High-Frequency Spring Probes here.