B
Series
Signal Integrity’s B Series 0.5mm pitch spring probes provide a robust range of contact solutions for fine-pitch semiconductor testing. This series offers specialized configurations for every test requirement, including the B2504 for high-current applications (up to 2.9 Amps) and the B2502 for high-frequency testing (17.0 GHz). With extensive operating length options and contact resistance as low as 30 mOhms, the B Series ensures reliable, transparent testing for BGA, QFN, and strip test applications.
B SERIES: HIGH-PERFORMANCE 0.5MM PITCH SPRING PROBES
Engineered for high-volume manufacturing, the B Series 0.5mm pitch spring probes deliver industry-leading signal integrity and mechanical reliability. Compare our top models below to find the ideal balance of current handling, spring force, and resistance for your specific test environment.
| Model | Initial Length (inch / mm) |
Op. Position (inch / mm) |
Spring Force | Bandwidth (Insertion Loss) |
Current (Max) |
Resistance | Inductance |
|---|---|---|---|---|---|---|---|
| B2502 | .091” / 2.31 | .085” / 2.16 | 32 g | 17.0 GHz | 1.5 A | 30 mΩ | 0.54 nH |
| B2504 | .214” / 5.42 | .190” / 4.82 | 24, 34 g | 8.8 GHz | 2.9 A | 60 mΩ | 1.12 nH |
| B2509 | .108” / 2.74 | .094” / 2.39 | 26 g | 13.2 GHz | 2.0 A | 90 mΩ | 0.60 nH |
| B2503 | .157” / 3.99 | .142” / 3.61 | 26, 32 g | 13.0 GHz | 1.7 A | 60 mΩ | 0.71 nH |
| B2514 | .116” / 2.95 | .104” / 2.64 | 26 g | 12.2 GHz | 2.0 A | 90 mΩ | 0.63 nH |
| B2501 | .162” / 4.11 | .150” / 3.81 | 20, 35 g | 11.2 GHz | 2.8 A | 50 mΩ | 0.97 nH |
| B2500 | .304” / 7.72 | .275” / 6.99 | 28 g | 6.4 GHz | 2.6 A | 80 mΩ | 1.73 nH |
| B2535 | .217” / 5.50 | .199” / 5.05 | 26, 31 g | – | 2.3 A | 55 mΩ | – |
| B2609 | .304” / 7.72 | .275” / 6.99 | 24 g | – | – | – | – |
| B2528 | .274” / 6.96 | .254” / 6.45 | 28, 35 g | – | – | – | – |
| B2702 | .224” / 5.70 | .199” / 5.05 | 21 g | – | – | – | – |
Overview
Key Features of Our 0.5mm Pitch Spring Probes
- Fine Pitch Versatility: Optimized for 0.5mm pitch applications, providing a robust solution for testing BGAs, QFNs, and other fine-pitch packages.
- High-Bandwidth Options: Delivers excellent signal fidelity with bandwidths up to 17.0 GHz (B2502) and low insertion loss for RF applications.
- High Current Capability: Handles drive currents up to 2.9 Amps (B2504) while maintaining low self-inductance.
- Wide Range of Lengths: Offers extensive Z-height options, from compact 2.31mm profiles (B2502) to extended reach probes up to 7.72mm (B2500) for complex stack-ups.
- Reliable Contact: Features low contact resistance (as low as 30 mOhms) and multiple spring force options (20g to 35g) to ensure reliable connection through contaminants.
Semiconductor Contacts B Series – 0.5MM (.0197) Pitch
B2502 – High Speed Short Profile
The shortest signal path for maximum bandwidth performance.
- Pitch: 0.5mm
- Bandwidth: 17.0 GHz
- Length: 2.31mm (0.091″)
- Resistance: 30 mΩ
- Inductance: 0.54 nH
B2504 – High Current Specialist
Designed to handle higher current loads in a 0.5mm form factor.
- Pitch: 0.5mm
- Current Rating: 2.9 A
- Bandwidth: 8.8 GHz
- Force: 24g, 34g
- Resistance: 60 mΩ
B2500 – Extended Reach
Long profile probe for applications requiring extra clearance.
- Pitch: 0.5mm
- Length: 7.72mm (0.304″)
- Current Rating: 2.6 A
- Bandwidth: 6.4 GHz
- Force: 28g
B2501 – Balanced Performance
Excellent trade-off between bandwidth, current, and length.
- Pitch: 0.5mm
- Bandwidth: 11.2 GHz
- Current Rating: 2.8 A
- Resistance: 50 mΩ
- Force: 20g, 35g
B2503 – RF & Digital Precision
Mid-length profile delivering superior RF performance up to 13 GHz.
The B2503 offers a robust solution for mixed-signal testing, providing reliable contact with low inductance in a standard height.
- Pitch: 0.5mm
- Bandwidth: 13.0 GHz
- Current: 1.7 A
- Inductance: 0.71 nH
Browse the full catalog of Signal Integrity High-Frequency Spring Probes here.