E
Series
Signal Integrity’s E Series 1.0mm pitch spring probes deliver extreme power and speed for rugged semiconductor testing. Engineered for demanding applications, this series features the E5533, capable of handling industry-leading currents up to 8.5 Amps, and multiple high-frequency options (E5566, E5544) with bandwidths exceeding 40 GHz. With robust construction and low contact resistance, the E Series ensures reliable, transparent operation for high-power BGA and LGA testing.
E SERIES: HIGH-PERFORMANCE 1.0MM PITCH SPRING PROBES
Engineered for high-volume manufacturing, the E Series 1.0mm pitch spring probes offer an unmatched combination of high current capability and signal integrity. Compare our top models below to find the ideal balance of power handling, spring force, and resistance for your specific test environment.
| Model | Initial Length (inch / mm) |
Op. Position (inch / mm) |
Spring Force | Bandwidth (Insertion Loss) |
Current (Max) |
Resistance | Inductance |
|---|---|---|---|---|---|---|---|
| E5533 | .144” / 3.66 | .119” / 3.02 | 25, 40 g | 25.3 GHz | 8.5 A | 20 mΩ | 0.72 nH |
| E5566 | .121” / 3.08 | .098” / 2.49 | 24, 35 g | > 40 GHz | 4.3 A | 20 mΩ | 0.49 nH |
| E5544 | .124” / 3.15 | .098” / 2.49 | 25 g | > 40 GHz | 2.7 A | 30 mΩ | 0.70 nH |
| E5548 | – | – | 20, 39 g | 14.5 GHz | 7.0 A | 25 mΩ | 1.04 nH |
| E5656 | .180” / 4.57 | .156” / 3.96 | 28, 36 g | 13.9 GHz | 6.0 A | 20 mΩ | 0.90 nH |
| E5593 | – | – | 27 g | 31.5 GHz | 6.0 A | 20 mΩ | 1.14 nH |
Overview
Key Features of Our 1.0mm Pitch Spring Probes
- Extreme Current Handling: Defines the standard for high-power testing with models capable of 8.5 Amps (E5533) and 7.0 Amps (E5548) continuous current.
- Ultra-High Bandwidth: Features high-speed designs (E5566, E5544) that exceed 40 GHz, ensuring transparency for the fastest digital and RF signals.
- Robust Pitch Design: Optimized for 1.0mm pitch applications, providing a sturdy mechanical interface for larger package testing.
- Low Inductance: Self-inductance as low as 0.49 nH (E5566) minimizes signal degradation in high-speed environments.
- Versatile Force Options: Standard and high-force options (up to 40g) ensure reliable contact through oxides and contaminants.
Semiconductor Contacts E Series – 1MM (.0394) Pitch
E5533 – Extreme Current Leader
Industry-leading 8.5A capacity for high-power applications.
- Pitch: 1.0mm
- Current Rating: 8.5 A
- Bandwidth: 25.3 GHz
- Force: 25g, 40g
- Resistance: 20 mΩ
E5566 – High Speed & Power
The ultimate combination: >40 GHz bandwidth with robust 4.3A power.
- Pitch: 1.0mm
- Bandwidth: > 40 GHz
- Current Rating: 4.3 A
- Inductance: 0.49 nH
- Length: 3.08mm (0.121″)
E5544 – RF Precision
Designed for ultra-high frequency testing exceeding 40 GHz.
- Pitch: 1.0mm
- Bandwidth: > 40 GHz
- Current Rating: 2.7 A
- Resistance: 30 mΩ
- Inductance: 0.70 nH
E5548 – High Power Standard
Reliable 7.0A current handling for power management testing.
- Pitch: 1.0mm
- Current Rating: 7.0 A
- Bandwidth: 14.5 GHz
- Force: 20g, 39g
- Resistance: 25 mΩ
E5656 – Robust General Purpose
A versatile 6.0A probe for a wide range of test applications.
The E5656 delivers solid all-around performance with high current handling and good bandwidth for general semiconductor testing.
- Pitch: 1.0mm
- Current: 6.0 A
- Bandwidth: 13.9 GHz
- Resistance: 20 mΩ
Browse the full catalog of Signal Integrity High-Frequency Spring Probes here.